Voltage Drop
1. Introduction to Electromagnetic Compatibility Testing The electromagnetic compatibility laboratory is a special type of laboratory established for electromagnetic compati…
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1. Introduction to Electromagnetic Compatibility Testing
The electromagnetic compatibility laboratory is a special type of laboratory established for electromagnetic compatibility tests. First, explain the basic concept of electromagnetic compatibility: it refers to the ability of electromagnetic systems and subsystems to work normally in their respective electromagnetic environments without reducing their performance due to electromagnetic interference. In order to verify whether the EMC design of electronic and electrical equipment is good, it is necessary to test the emission interference, transmission characteristics of various electromagnetic interference sources, and whether the interfered equipment can withstand the load during the whole process of research and development, and verify whether the equipment meets the relevant electromagnetic compatibility. Standards and Specifications.
2. An Magnetic Testing - Introduction to Electromagnetic Compatibility Laboratory
An Magnetics has an internationally leading electromagnetic compatibility EMC laboratory, including: two 3-meter anechoic chambers and two conduction chambers, covering complete EMI and EMS testing requirements. Most of the testing room instruments use well-known foreign brands, such as German RS , Agilent, etc.; the laboratory has been recognized by authoritative organizations in many countries, such as China CNAS L6214, CMA (201819013768), the United States UL/A2LA (4422.01), South Korea KTC, Germany TÜV and other accreditations, the detection methods and test data are accurate, and have been widely recognized Customer trust and support.
3. Electromagnetic Compatibility Certification Project
Americas: FCC SDOC, FCC ID, ISED, ISED ID, etc.;
Europe: CE-EMC, E-Mark, etc.;
Asia: CCC, CQC, BSMI, KC, VCCI, PSE, etc.;
Australia: C-TICK, RCM, etc.;
4. Electromagnetic Compatibility Testing Items and Standards
Electromagnetic compatibility testing includes electromagnetic interference test (EMI) and electromagnetic immunity test (EMS). The electromagnetic compatibility standard requires that products related to electronic and electrical equipment must meet the radiated interference and conducted interference emission specifications, as well as the radiation tolerance and conducted tolerance specifications.
(1) Electromagnetic Interference (EMI, including CE and RE), the main contents of the test are: the test of the conducted interference and radiated interference emission of electronic and electrical products and equipment in various electromagnetic noise environments, and the interference during transmission of various signals. Test of transfer characteristics.
(2) The main contents of electromagnetic endurance (EMS, including CS and RS) test are:
1. Radiation tolerance test to electric field and magnetic field;
2. Conduction tolerance test for injected interference of power lines, control lines, signal lines, ground lines, etc.;
3. Tolerance test for electrostatic discharge and various transient electromagnetic waves (surge or electrical fast transient).
Test items |
standard |
Radiation |
CISPR32 & 11 &14-1 &15, EN55032 & 11 &14-1 &15, AS/NZS CISPR32 & 11 &14-1 &15, KN32 & 11 &14-1 &15, ICES-003 & ICES-005&ICES-001, FCC Part15 & 18, VCCI, GB/T9254, GB/T13837, GB/T17743, GB4343.1,GB 4824 |
Conduction (Conduction) |
CISPR32 & 11 &14-1 &15, EN55032 & 11 &14-1 &15, AS/NZS CISPR32 & 11 &14-1 &15, KN32 & 11 &14-1 &15, ICES-003 & ICES-005&ICES-001, FCC Part15 & 18, VCCI, GB/T9254, GB/T13837, GB/T17743, GB4343.1,GB 4824 |
Power Clamp |
CISPR14-1,EN55014-1,AS CISPR14-1, GB4343.1, KN14-1; GB/T 13837 |
Magnetic Emission |
CISPR15, EN55015, AS / NZS CISPR15, GB / T17743 |
Harmonic current (Harmonic) |
IEC/EN61000-3-2 |
Voltage Fluctuation and Flicker (Flicker) |
IEC/EN61000-3-3 |
Electrostatic discharge (ESD) |
IEC/EN61000-4-2、GB/T17626.2 |
Radiated Immunity (R/S) |
IEC/EN61000-4-3、GB/T17626.3 |
Burst Immunity (EFT/B) |
IEC/EN61000-4-4、GB/T17626.4 |
Surge (SURGE) |
IEC/EN61000-4-5、GB/T17626.5 |
Conducted immunity (C/S) |
IEC/EN61000-4-6、GB/T17626.6 |
Power frequency magnetic field (M/S) |
IEC/EN61000-4-8、GB/T17626.8 |
Dips/Interrupts (DIPS) |
IEC/EN61000-4-11、GB/T17626.11 |
Ring wave |
IEC/EN61000-4-12、GB/T17626.12 |
Harmonic and interharmonic anti-interference |
TEC/EN61000-4-13、GB/T17626.13 |
5. Electromagnetic Compatibility Laboratory
test site |
Pilot projects |
standard |
Remark |
3m method full anechoic chamber |
Radiated Emission |
GB4824-2004(CISPR11-2003) GB9254-2008(CISPR22-2006) |
30MHz |
Radiated immunity |
GB17626.3-2006(IEC61000-4-3:2002) |
80MHz |
|
Conducted immunity measurement shielded room |
Electrical Fast Transient Burst Immunity Test |
GB17626.4 |
Up to 7kV |
Conducted disturbance immunity induced by radio frequency fields |
GB17626.6 |
Up to 30V |
|
Insertion loss test for electrical lighting and similar equipment |
GB17743 |
9KHz-30MHz |
|
Radiated electromagnetic disturbance test for electrical lighting and similar equipment |
GB17743 |
|
|
Harmonic Flicker Measurement Shielded Room |
Harmonic current emission test |
GB17625.1-2012(IEC 61000-3-2:2009) GB17625.6-2003(IEC 61000-3-4:1998) GB17625.7-2013 |
Up to 75A |
Voltage Variation, Voltage Fluctuation and Flicker |
GB17625.2-2007(IEC 61000-3-3:2005) GB17625.3-2000(IEC 61000-3-5:1994) |
Up to 100A |
|
AC Power Port Harmonic Immunity |
GB17626.13-2006(IEC 61000-4-13:2002) |
Up to 100A |
|
Voltage fluctuation immunity test |
GB17626.14-2005(IEC 61000-4-14:2002) |
Up to 100A |
|
DC ripple immunity |
GB17626.17-2005(IEC 61000-4-17:2002) |
Up to 100A |
|
Three-phase voltage unbalance test |
GB17626.27-2006(IEC 61000-4-27:2000) |
Up to 100A |
|
Power frequency frequency variation immunity |
GB17626.28-2006(IEC 61000-4-28:2001) |
Up to 100A |
|
Greater than 16A voltage dips, short interruptions and voltage changes |
GB17626.34-2012(IEC 61000-4-34:2009) |
Up to 100A |
|
Voltage dips, short interruptions and voltage changes at the DC power input port |
GB17626.29-2006(IEC 61000-4-29:2000) |
Up to 100A |
|
ESD Measurement Shielded Room |
Electrostatic discharge immunity test |
GB17626.2-2006(IEC 61000-4-2:2001) |
Up to 30kV |
Voltage dips, short interruptions and voltage changes |
GB17626.11-2008(IEC 61000-4-11:2004) |
Up to 100A; power off (0-100%) |
|
Low frequency common mode conducted immunity |
GB17626.16-2007(IEC 61000-4-16:2002) |
The highest disturbance level is 30V |
|
Transient Immunity Measurement Shielded Room |
Surge immunity |
GB17626.5-2008(IEC 61000-4-5:2005) |
Up to 10kV |
Damped Oscillating Magnetic Field Immunity |
GB17626.10-1998(IEC 61000-4-10:1993) |
Up to 3kV; three-phase 440V/100A; |
|
Oscillating wave immunity test |
GB17626.12-1998(IEC 61000-4-12:1995) |
Up to 3kV; three-phase 440V /100A |
|
Power frequency magnetic field immunity |
GB17626.8-2006(IEC 61000-4-8:2001) |
Short-time up to 1000A/m |
|
Immunity to pulsed magnetic fields |
GB17626.9-2011(IEC 61000-4-9:2001) |
Up to 2000A/m |